1. Measurement of wavelength, guide wavelength and frequency using X-band waveguide test
bench. Calculation of broad wall dimension of a X-band waveguide. Determination of phase
and group velocities within a waveguide from Dispersion diagram [ω−β Plot].
2. Measurement of unknown impedance (inductive, capacitive and resonant windows) using shift
in minima technique.
3. Calibration of a crystal detector using waveguide test bench.
4. Measurement of Attenuator [AD – Dissipative attenuation and AR – Reflective attenuation].
5. Measurement of coupling factor and Directivity of a Directional coupler using calibrated
attenuator.
6. Klystron characteristics [Static method and dynamic method] using power meter with
bolometer and calibrated wave-meter.
7. Study of Gunn Oscillator characteristics using power meter with bolometer and calibrated
wave-meter.
8. Measurement of reflection coefficient using two directional couplers and one calibrated
attenuator.